A Concise Algorithm for Determining Sample Sizes for Inspections

Publication Date
Volume
34
Issue
1
Start Page
48
Author(s)
Ming-Shih Lu - Brookhaven National Laboratory
Robert Kennett - Brookhaven National Laboratory
File Attachment
V-34_1.pdf2.36 MB
Abstract
A model to determine multi-level sample size distributions necessary to achieve certain detection goals is presented here. The model deals with both random and systematic errors and allows a flexible rejection limit. In particular, when binomial approximation is used, the solutions for the sample sizes to achieve a stipulated detection probability goal are expressed in a closed, analytical form. The results obtained are compared with those obtained with the existing method used in international safeguards.
Additional File(s) in Volume
V-34_1.pdf2.36 MB
V-34_2.pdf604.91 KB
V-34_3.pdf810.39 KB
V-34_4.pdf343.86 KB