Year
2004
Abstract
For the efficient particle analysis based on secondary ion mass spectrometry (SIMS) for safeguards swipe samples, particle recovery method by vacuum suction – impact collection was developed. A main feature is that the method is quite simple and the particles are collected without agglomeration. The recovery efficiency was 48 ± 9 %, which is better than that with conventionally-used ultrasoneration method. Prior to the SIMS measurements, the carriers with the collected particles are screened by total reflection X-ray fluorescence spectrometry (TXRF) for the presence of uranium. This technique gave greater sensitivity for uranium than commonly-used X-ray fluorescence spectrometry (XRF). We are also developing a particle analysis method based on fission track (FT) – thermal ionization mass spectrometry (TIMS). In the FT-TIMS method, the vacuum suction method was also applied to the particle collection with a polycarbonate membrane filter, of which the FT detector is prepared.