Symmetric Pin Diversion Detection using a Partial Defect Detector (PDET)

Since the signature from the Partial Defect Detector (PDET) is principally dependent on the geometric layout of the guide tube locations, the capability of the technique in detecting symmetric diversion of pins needs to be determined. The Monte Carlo simulation study consisted of cases where pins were removed in a symmetric manner and the resulting signatures were examined. In addition to the normalized gamma-to-neutron ratios, the neutron and gamma signatures normalized to their maximum values, were also examined. Examination of the shape of the three curves as well as of the peak-to- valley differences in excess of the maximum expected in intact assemblies, indicated pin diversion. A set of simulations with various symmetric patterns of diversion were examined. The results from these studies indicated that symmetric diversions as low as twelve percent could be detected by this methodology.