We report on a new capability to rapidly produce elemental maps of large-area swipe samples using a multi-pixilated fluorescence detector at the Submicron Resolution X-ray Spectroscopy Beamline at the National Synchrotron Light Source-II, Brookhaven National Laboratory. In under three hours, full spectrum x-ray fluorescence (XRF) response was recorded for a 10-by-10 cm2 cotton swipe sample in a 1,000 x 1,000 cell matrix. Each cell contains a full XRF spectrum for its respective 100 micron square area. We discuss XRF results for uranium, iron, zinc, and lead. The availability of this new detector makes it possible to screen samples non-destructively without any pretreatment. The new capability can be coupled with more detailed non-destructive XRF analysis at submicron spatial resolution. Ultimately, by leveraging robotics and a standard sample holder design it would be possible to develop a workflow that would allow for rapid scanning of many large-area swipes followed by detailed studies on selected areas of interest.
Year
2017
Abstract