Characterization of CZT Radiation Detectors at NSLS

Year
2010
Author(s)
A. Hossain - Brookhaven National Laboratory
Y. Cui - Brookhaven National Laboratory
Aleksey Bolotnikov - Brookhaven National Laboratory
G. Camarda - Brookhaven National Laboratory
G. Yang - Brookhaven National Laboratory
K-H Kim - Brookhaven National Laboratory
R. Gul - Brookhaven National Laboratory
L. Xu - Brookhaven National Laboratory
R. B. James - Brookhaven National Laboratory
L. Marchini - Brookhaven National Laboratory
Abstract
Cadmium Zinc Telluride (CZT) is the most promising high-Z semiconductor material for high-resolution, room-temperature gamma radiation spectrometers for use in nuclear- detection applications. The availability of large-volume and low-cost CZT crystals is the primary problem limited their deployment. The root cause is the state of material perfection of CZT crystals. At BNL we seek to understand the material issues limiting the device performance and provide feedback to the crystal growers and fabricators, who in turn apply the necessary changes to achieve better material quality. Many CZT samples are characterized as part of this feedback-and-improvement process. One of the main tools used in the device and material characterization is collimated synchrotron X-ray radiation provided by the National Synchrotron Light Source (NSLS). Data from the NSLS have helped to elucidate the roles of non-uniformity and extended defects in CZT. A description of the characterization techniques and the most recent data will be presented.